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1
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Ideal for characterizing RF and microwave components such as filters, antennas, amplifiers, and cables.
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2
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Supports S11, S21, S12, and S22 for complete device characterization.
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3
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Integrates seamlessly into PXI Express test systems for scalable, multi-instrument automated test setups.
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4
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Optimized for fast sweeps and high-throughput automated testing environments.
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5
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Saves rack space by leveraging PXIe chassis instead of standalone benchtop instruments.
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6
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Ensures accurate testing of both low-loss and high-reflection devices.
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7
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Provides SOLT, TRL, and other calibration methods to ensure precise measurements.
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8
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Fully compatible with automated test scripts and ATE systems using SCPI commands.
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9
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Works with PC-based control software for measurement visualization, data logging, and system-level automation.
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10
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Perfect for manufacturing test lines, multi-channel setups, and high-speed development workflows.
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